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AD7658BSTZ-REEL 数据表(PDF) 10 Page - Analog Devices

部件名 AD7658BSTZ-REEL
功能描述  250 kSPS, 6-Channel,Simultaneous Sampling, Bipolar 12/14/16-Bit ADC
Download  25 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

AD7658BSTZ-REEL 数据表(HTML) 10 Page - Analog Devices

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AD7658/AD7657/AD7656
Preliminary Technical Data
Rev. PrI | Page 10 of 25
ABSOLUTE MAXIMUM RATINGS
Table 5. TA = 25°C, unless otherwise noted
Parameter
Rating
VDD to AGND, DGND
-0.3 V to +16.5 V
VSS to AGND, DGND
+0.3 V to –16.5 V
VCC to AGND, DGND
-0.3V to +7V
VDRIVE to VCC
-0.3 V to VCC + 0.3V
AGND to DGND
-0.3 V to +0.3 V
VDRIVE to DVDD
-0.3 V to DVDD + 0.3V
Analog Input Voltage to AGND
VSS – 0.5V to VDD + 0.5V
Digital Input Voltage to DGND
-0.3 V to VDRIVE +0.3 V
Digital Output Voltage to GND
-0.3 V to VDRIVE +0.3V
REFIN to AGND
-0.3 V to VCC +0.3V
Input Current to Any Pin Except Supplies2
±10mA
Operating Temperature Range
-40°C to +85°C
Storage Temperature Range
-65°C to +150°C
Junction Temperature
+150°C
64-LQFP Package, Power Dissipation
θJA Thermal Impedance
TBD°C/W
θJC Thermal Impedance
TBD°C/W
Pb-free Temperature, Soldering
Reflow
260(+0)°C
ESD
TBD kV
1Transient currents of up to 100 mA will not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those listed in the operational sections
of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.


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