MC74VHC1G01DFT2G datasheet(2/6 Pages) ONSEMI

部件名	MC74VHC1G01DFT2G

功能描述	2-Input NAND Gate with Open Drain Output

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制造商	ONSEMI [ON Semiconductor]

网页	http://www.onsemi.com

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MC74VHC1G01

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MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

VCC

DC Supply Voltage

*0.5 to )7.0

V

VIN

DC Input Voltage

−0.5 to +7.0

V

VOUT

DC Output Voltage

*0.5 to VCC )0.5

V

IIK

DC Input Diode Current

−20

mA

IOK

DC Output Diode Current

VOUT t GND; VOUT u VCC

$20

mA

IOUT

DC Output Sink Current, per Pin

25

mA

ICC

DC Supply Current, VCC and GND Pin

$25

mA

TSTG

Storage Temperature Range

*65 to )150

°C

TL

Lead Temperature, 1 mm from Case for 10 Seconds

260

°C

TJ

Junction Temperature Under Bias

)150

°C

qJA

Thermal Resistance

SC70−5/SC−88A (Note 1)

TSOP−5

350

230

°C/W

PD

Power Dissipation in Still Air at 85

°C

SC70−5/SC−88A

TSOP−5

150

200

mW

MSL

Moisture Sensitivity

Level 1

FR

Flammability Rating

Oxygen Index: 28 to 34

UL 94 V−0 @ 0.125 in

VESD

ESD Withstand Voltage

Human Body Model (Note 2)

Machine Model (Note 3)

Charged Device Model (Note 4)

u2000

u200

N/A

V

ILATCHUP

Latchup Performance

Above VCC and Below GND at 125°C (Note 5)

$500

mA

Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit

values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.

2. Tested to EIA/JESD22−A114−A.

3. Tested to EIA/JESD22−A115−A.

4. Tested to JESD22−C101−A.

5. Tested to EIA/JESD78.

RECOMMENDED OPERATING CONDITIONS

Symbol

Characteristics

Min

Max

Unit

VCC

DC Supply Voltage

2.0

5.5

V

VIN

DC Input Voltage

0.0

5.5

V

VOUT

DC Output Voltage

0.0

7.0

V

TA

Operating Temperature Range

−55

+125

°C

tr , tf

Input Rise and Fall Time

VCC = 3.3 V ± 0.3 V

VCC = 5.0 V ± 0.5 V

0

100

20

ns/V

DEVICE JUNCTION TEMPERATURE VERSUS

TIME TO 0.1% BOND FAILURES

Junction

Temperature

°C

Time, Hours

Time, Years

80

1,032,200

117.8

90

419,300

47.9

100

178,700

20.4

110

79,600

9.4

120

37,000

4.2

130

17,800

2.0

140

8,900

1.0

1

10

100

1000

FAILURE RATE OF PLASTIC = CERAMIC

UNTIL INTERMETALLICS OCCUR

Figure 3. Failure Rate vs. Time Junction Temperature

TIME, YEARS

类似零件编号 - MC74VHC1G01DFT2G

制造商	部件名	数据表	功能描述
ON Semiconductor	MC74VHC1G01DFT2G	84Kb / 6P	Single 2-Input NAND Gate with Open Drain Output December, 2016 ??Rev. 16
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	MC74VHC1G01DFT2G	172Kb / 14P	Single 2-Input NAND Gate with Open Drain Output April, 2022 ??Rev. 20
	MC74VHC1G01DFT2G-L22038	172Kb / 14P	Single 2-Input NAND Gate with Open Drain Output April, 2022 ??Rev. 20

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类似说明 - MC74VHC1G01DFT2G

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