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GRM1885C2A110GA01 Datasheet(数据表) 3 Page - Murata Manufacturing Co., Ltd

部件型号  GRM1885C2A110GA01
说明  Chip Multilayer Ceramic Capacitors for General Purpose
下载  30 Pages
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制造商  MURATA1 [Murata Manufacturing Co., Ltd]
网页  http://www.murata.com
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GRM1885C2A110GA01 Datasheet(HTML) 3 Page - Murata Manufacturing Co., Ltd

 
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No.
9
Adhesive Strength of
No removal of the terminations or other defect should occur.
Solder the capacitor on the test substrate shown in Fig.3.
Termination
Applied Force :
5N
Holding Time :
10+/-1s
Applied Direction :
In parallel with the test substrate and vertical with the capacitor side
10 Vibration
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Kind of Vibration :
A simple harmonic motion 10Hz to 55Hz to 10Hz
Capacitance Within the specified initial value.
Vibration Time :
1min
Total Amplitude :
1.5mm
Q or D.F.
Within the specified initial value.
This motion should be applied for a period of 2hours in each 3 mutually perpendicular directions(total of 6hours).
11 Substrate
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.1.
Bending Test
Pressurization Method :
Shown in Fig.2.
Capacitance Within +/-5% or +/-0.5pF (Whichever is larger)
Flexure :
1mm
Change
Holding Time :
5+/-1s
Soldering Method :
Reflow soldering
12 Solderability
95% of the terminations is to be soldered evenly and continuously.
Test Method :
Solder bath method
Flux :
Solution of rosin ethanol 25(mass)%
Preheat :
80℃ to 120℃、10s to 30s
Solder :
Sn-3.0Ag-0.5Cu(Lead Free Solder)
Test Temp. :
245+/-5℃
Test Time :
2+/-0.5s
13 Resistance
Appearance
No defects or abnormalities.
Test Method :
Solder bath method
to Soldering
Solder :
Sn-3.0Ag-0.5Cu(Lead Free Solder)
Heat
Capacitance Within +/-2.5% or +/-0.25pF (Whichever is larger)
Solder Temp. :
270+/-5℃
Change
Test Time :
10+/-0.5s
Q or D.F.
Within the specified initial value.
Preheat Temp. :
120℃ to 150℃
Preheat Time :
1min
I.R.
Within the specified initial value.
Voltage
No defects.
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
Proof
14 Temperature
Appearance
No defects or abnormalities.
Solder the capacitor on the test substrate shown in Fig.3.
Sudden
Cycles
:
5 cycles
Change
Capacitance Within +/-2.5% or +/-0.25pF (Whichever is larger)
Change
Q or D.F.
Within the specified initial value.
I.R.
Within the specified initial value.
Voltage
No defects.
Proof
Post-treatment :
Let sit for 24+/-2hours at room temperature, then measure.
Item
Specification
Test Method (Ref. Standard:JIS C 5101, IEC60384)
Step
Temperature(℃)
Time (min)
1
Min.Operating Temp. +0/-3
30+/-3
2
Reference Temp.
2 to 3
3
Max.Operating Temp. +3/-0
30+/-3
4
Reference Temp.
2 to 3
Step
Temperature(°C)
Applying Voltage
1
Reference Temp. +/-2
2
Min. Operating Temp. +/-3
3
*
Reference Temp. +/-2
4
Max. Operating Temp. ±3
5
Reference Temp. +/-2
No bias
GRM1885C2A110GA01-01A




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