SN54ALS01, SN74ALS01

QUADRUPLE 2-INPUT POSITIVE-NAND GATES

WITH OPEN-COLLECTOR OUTPUTS

SDAS188 – D2661, APRIL 1982 – REVISED MAY 1986

POST OFFICE BOX 655303

Copyright

5BASIC

1

Outline Packages, Ceramic Chip Carriers,

and Standard Plastic and Ceramic 300-mil

DIPs

Reliability

description

These devices contain four independent 2-input

NAND gates. They perform the Boolean functions

Y = A

•B or Y = A+B in positive logic. The

open-collector outputs require pullup resistors to

perform correctly. They may be connected to other

open-collector outputs to implement active-low

wired-OR or active-high wired-AND functions.

Open-collector devices are often used to generate

The SN54ALS01 is characterized for operation

over the full military temperature range of – 55

°C

to 125

°C. The SN74ALS01 is characterized for

operation from 0

°C to 70°C.

FUNCTION TABLE

(each gate)

INPUTS

OUTPUT

A

B

Y

H

H

L

L

XH

X

L

H

&

13

4Y

10

3Y

4

2Y

1Y

1

4B

12

4A

11

3B

9

3A

8

2B

6

2A

5

3

1B

1A

2

† This symbol is in accordance with ANSI/IEEE Std 91-1984 and

IEC Publication 617-12.

Pin numbers shown are for D, J, and N packages.

4A

4B

4Y

3A

3B

3Y

2A

2B

2Y

1Y

1B

1A

logic diagram (positive logic)

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1Y

1A

1B

2Y

2A

2B

GND

4Y

4B

4A

3Y

3B

3A

SN54ALS01 ...J PACKAGE

SN74ALS01 ...D OR N PACKAGE

(TOP VIEW)

3

2

1 20 19

910 11 12 13

4

5

6

7

8

18

17

16

15

14

4B

NC

4A

NC

3Y

1B

NC

2Y

NC

2A

SN54ALS01 . . . FK PACKAGE

(TOP VIEW)

NC – No internal connection

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.