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MNLM193A-X 数据表(PDF) 1 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 MNLM193A-X
功能描述  LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS
Download  12 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

MNLM193A-X 数据表(HTML) 1 Page - National Semiconductor (TI)

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Original Creation Date: 05/18/95
Last Update Date: 06/14/04
Last Major Revision Date: 09/02/97
MNLM193A-X REV 1B3
MICROCIRCUIT DATA SHEET
LOW POWER LOW OFFSET VOLTAGE DUAL COMPARATORS
General Description
The LM193A consists of two independent precision voltage comparators with an offset
voltage specification as low as 2.0mV max for two comparators which were designed
specifically to operate from a single power supply over a wide range of voltages.
Operation from split power supplies is also possible and the low power supply current
drain is independent of the magniture of the power supply voltage. These comparators also
have a unique characteristic in that the input common-mode voltage range includes ground,
even though operated from a single power supply voltage.
Application areas include limit comparators, simple analog to digital converters; pulse,
squarewave and time delay generators; wide range VCO; MOS clock timers; multivibrators and
high voltage digital logic gates. The LM193A was designed to directly interface with TTL
and CMOS. When operated from both plus and minus power supplies, the LM193A will directly
interface with MOS logic where their low power drain is a distinct advantage over standard
comparators.
NS Part Numbers
LM193AH-QMLV
LM193AH/883
LM193AJ-QMLV
LM193AJ/883
Industry Part Number
LM193A
Prime Die
LM193A
Controlling Document
See Features Page
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description
Temp ( C)
o
1
Static tests at
+25
2
Static tests at
+125
3
Static tests at
-55
4
Dynamic tests at
+25
5
Dynamic tests at
+125
6
Dynamic tests at
-55
7
Functional tests at
+25
8A
Functional tests at
+125
8B
Functional tests at
-55
9
Switching tests at
+25
10
Switching tests at
+125
11
Switching tests at
-55
1


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