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AM27C256-55 数据表(PDF) 11 Page - Advanced Micro Devices |
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AM27C256-55 数据表(HTML) 11 Page - Advanced Micro Devices |
11 / 12 page AMD 2-42 Am27C256 SWITCHING TEST CIRCUIT Device Under Test CL +5.0 V CL = 100 pF including jig capacitance (30 pF for -55, -70) 6.2 k Ω 2.7 k Ω Diodes = IN3064 or Equivalent 08007H-8 SWITCHING TEST WAVEFORM 2.4 V 0.45 V 2.0 V 0.8 V 2.0 V 0.8 V Test Points Input Output 3 V 0 V 1.5 V 1.5 V Input Output Test Points AC Testing: Inputs are driven at 2.4 V for a logic “1” and 0.45 V for a logic “0”. Input pulse rise and fall times are ≤ 20 ns. 08007H-9 AC Testing: Inputs are driven at 3.0 V for a logic “1” and 0 V for a logic “0”. Input pulse rise and fall times are ≤ 20 ns for -55 and -70. |
类似零件编号 - AM27C256-55 |
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类似说明 - AM27C256-55 |
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