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CDCM61001 数据表(PDF) 4 Page - Texas Instruments |
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CDCM61001 数据表(HTML) 4 Page - Texas Instruments |
4 / 35 page CDCM61001 SCAS869F – FEBRUARY 2009 – REVISED JUNE 2011 www.ti.com ELECTRICAL CHARACTERISTICS At VCC = 3 V to 3.6 V and TA = –40°C to +85°C, unless otherwise noted. CDCM61001 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Control Pin LVCMOS Input Characteristics VIH Input high voltage 0.6VCC V VIL Input low voltage 0.4VCC V IIH Input high current VCC = 3.6 V, VIL = 0 V 200 μA IIL Input low current VCC = 3 V, VIH = 3.6 V –200 μA LVCMOS Output Characteristics(1) (See Figure 9 and Figure 10) fOSC_OUT Bypass output frequency 21.875 28.47 MHz fOUT Output frequency 43.75 250 MHz VCC VOH Output high voltage VCC = min to max, IOH = –100 μA V –0.5 VOL Output low voltage VCC = min to max, IOL = 100 μA 0.3 V ps, tRJIT RMS phase jitter 250 MHz (10 kHz to 20 MHz) 0.85 RMS tSLEW-RATE Output rise/fall slew rate 20% to 80% 2.4 V/ns ODC Output duty cycle 45% 55% ICC, Device current, LVCMOS fIN = 25 MHz, fOUT = 250 MHz, CL = 5 pF 95 110 mA LVCMOS LVPECL Output Characteristics(2) (See Figure 11 and Figure 12) fOUT Output frequency 43.75 683.264 MHz VCC VCC VOH Output high voltage V –1.18 –0.73 VCC VOL Output low voltage VCC –2 V –1.55 |VOD| Differential output voltage 0.6 1.23 V ps, tRJIT RMS phase jitter 625 MHz (10 kHz to 20 MHz) 0.77 RMS tR/tF Output rise/fall time 20% to 80% 175 ps ODC Output duty cycle 45% 55% ICC, Device current, LVPECL fIN = 25 MHz, fOUT = 625 MHz 100 115 mA LVPECL LVDS Output Characteristics(3) (See Figure 13 and Figure 14) fOUT Output frequency 43.75 683.264 MHz |VOD| Differential output voltage 0.247 0.454 V ΔVOD VDD magnitude change 50 mV VOS Common-mode voltage 1.125 1.375 V ΔVOS VOS magnitude change 50 mV ps, tRJIT RMS phase jitter 625 MHz (10 kHz to 20 MHz) 0.73 RMS tR/tF Output rise/fall time 20% to 80% 255 ps ODC Output duty cycle 45% 55% ICC, LVDS Device current, LVDS fIN = 25 MHz, fOUT = 625 MHz 90 105 mA (1) Figure 9 and Figure 10 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in. (2) Figure 11 and Figure 12 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in. (3) Figure 13 and Figure 14 show dc and ac test setups, respectively. Jitter measurements made using 25-MHz quartz crystal in. 4 Copyright © 2009–2011, Texas Instruments Incorporated |
类似零件编号 - CDCM61001_17 |
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类似说明 - CDCM61001_17 |
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