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STF10N105K5 数据表(PDF) 5 Page - STMicroelectronics |
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STF10N105K5 数据表(HTML) 5 Page - STMicroelectronics |
5 / 18 page STF10N105K5, STP10N105K5, STW10N105K5 Electrical characteristics DocID026932 Rev 2 5/18 Table 7: Source-drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 6 A ISDM (1) Source-drain current (pulsed) 24 A VSD (2) Forward on voltage ISD = 6 A, VGS = 0 1.5 V trr Reverse recovery time ISD = 6 A, di/dt = 100 A/µs VDD = 60 V 345 ns Qrr Reverse recovery charge 3.53 µC IRRM Reverse recovery current 20.5 A trr Reverse recovery time ISD = 6 A, di/dt = 100 A/µs VDD = 60 V TJ = 150 °C 540 ns Qrr Reverse recovery charge 5.05 µC IRRM Reverse recovery current 18.5 A Notes: (1) Pulse width limited by safe operating area. (2) Pulsed: pulse duration = 300 µs, duty cycle 1.5%. Table 8: Gate-source Zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)GSO Gate-source breakdown voltage IGS = ± 1 mA, ID = 0 30 - - V The built-in back-to-back Zener diodes have been specifically designed to enhance the ESD capability of the device. The Zener voltage is appropriate for efficient and cost- effective intervention to protect the device integrity. These integrated Zener diodes thus eliminate the need for external components. |
类似零件编号 - STF10N105K5 |
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类似说明 - STF10N105K5 |
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