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NE1618 数据表(PDF) 5 Page - NXP Semiconductors |
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NE1618 数据表(HTML) 5 Page - NXP Semiconductors |
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5 / 16 page  Philips Semiconductors Product data NE1618 Temperature monitor for microprocessor systems 2002 Jan 04 5 ELECTRICAL CHARACTERISTICS VDD = 3.3 V; Tamb = 5 °C to +120 °C; unless otherwise noted. PARAMETER CONDITIONS LIMITS UNIT PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Temperature resolution 1 °C Local temperature error Tamb = +60 °C to +100 °C VDD = 3.3 V ±0.75 ±1.5 °C VDD = 5.0 V 1 ±1.25 ±2.0 °C Tamb = 0 °C to +120 °C VDD = 3.3 V ±2.0 ±3.0 °C VDD = 5.0 V 1 ±2.5 ±3.5 °C Remote temperature error (1 Cl i ) Tremote = +60 °C to +100 °C VDD = 3.3 V ±3.0 °C (1 °C resolution) VDD = 5.0 V 1 ±3.5 °C Tremote = 0 °C to +120 °C VDD = 3.3 V ±5.0 °C VDD = 5.0 V 1 ±5.5 °C Extended Remote temp error (0 12 Cl i ) Tremote = +70 °C to +100 °C VDD = 3.3 V ±1.0 °C (0.125 °C resolution) VDD = 5.0 V 1 ±1.5 °C Tremote = 0 °C to +120 °C VDD = 3.3 V ±3.0 °C VDD = 5.0 V 1 ±3.5 °C Extended relative temp error 2 (0 12 Cl i ) Tremote = +70 °C to +100 °C VDD = 3.3 V ±0.25 °C (0.125 °C resolution) VDD = 5.0 V 1 ±0.75 °C Tremote = 0 °C to +120 °C VDD = 3.3 V ±0.50 °C VDD = 5.0 V 1 ±1.0 °C Under voltage lockout 3 VDD input disables A/D conversion 4 2.1 2.95 V Power-on reset threshold VDD input falling edge 5 1.0 2.5 V Power supply current (average) Conversion data = 02h 80 160 µA Conversion data = 05h 100 270 µA Power supply current (standby) SMBus inactive 3 10 µA Conversion time (busy duration) Basic measurement 150 ms Extended measurement 750 ms Conversion rate error Percentage error in programmed rate > 1 Hz 6 –30 +30 % Remote sensor source current HIGH level 100 µA LOW level 10 µA Address pin bias current Momentary as the address is being read 7,8 50 µA NOTES: 1. The NE1618 is optimized for 3.3 VDD operation. The listed accuracy limits for 5 VDD operation are guaranteed by design and 100% QA sample tested in production. 2. Guaranteed by design. 3. Definition of Under Voltage Lockout (UVL): The value of VDD below which the internal A/D converter is disabled. This is designed to be a minimum of 200 mV above the power-on reset. During the time that it is disabled, the temperature that is in the “read temperature registers” will remain at the value that it was before the A/D was disabled. This is done to eliminate the possibility of reading unexpected false temperatures due to the A/D converter not working correctly due to low voltage. In case of power-up (rising VDD), the reading that is stored in the “read temperature registers” will be the default value of 0 °C. VDD will rise to the value of UVL, at which point the A/D will function correctly and normal temperatures will be read. 4. VDD (rising edge) voltage below which the ADC is disabled. 5. VDD (falling edge) voltage below which the logic is reset. 6. For conversion rate ≤ 1 Hz, extended measurement requires about 400 ms more for conversion. 7. Address is read at power-up and at start of conversion for all conversions except the fastest rate. 8. Due to the bias current, any pull-up/down resistors should be ≤ 2 kΩ. |
类似零件编号 - NE1618 |
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类似说明 - NE1618 |
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