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CX1205A 数据表(PDF) 3 Page - Keysight Technologies |
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CX1205A 数据表(HTML) 3 Page - Keysight Technologies |
3 / 32 page 03 | Keysight | CX3300 Series Device Current Waveform Analyzer - Data Sheet Greater demand for transient current measurements Researchers working on advanced semiconductor or non-volatile memory devices such as ReRAM and PRAM are struggling to observe the behavior of newly developed materials when a short voltage pulse (< 100 ns) is applied. Since the transient current ranges from sub-nA to over mA, it is very difficult to clearly detect entire transient current behavior. Greater demand for power and current reduction Engineers working on battery-powered device development are under greater pressure to obtain a reduction in power and current consumption. As the recent technology trend in low power IoT, M2M, wearables, etc. has significantly accelerated this pressure, there is a need to reduce more unused power from existing devices. As a result, engineers are forced to look into even component level dynamic current consumption, which is always very difficult to measure especially for low-power devices used in IoT enabled products. What makes wideband low-level current waveform measure- ments so difficult? 1. Limited dynamic range For example, most of the battery-powered devices have low power status such as “sleep state” or “standby state” that consume very little supply current such as less than 1 μA, while the “active state” usually requires more than 10 mA current. It is difficult to measure such a wide dynamic range of currents with a single measurement. 2. Large measurement noise Clamp-on type current probes are widely used, but measuring low-level current less than 1 mA is always difficult due to the large noise floor. Using a shunt resistor and an oscilloscope is very useful, but the minimum measurable current is limited due to the noise floor and the voltage drop across the resistor. 3. Limited bandwidth Low-level current waveform measurements with a certain level of resolution need a tradeoff with bandwidth, otherwise wideband measurements may degrade the resolu- tion. Using a multimeter or an ammeter is popular for high resolution measurements, but not appropriate for wideband current measurements due to the lesser bandwidth. It is also difficult to measure multiple ranges with the same wide bandwidth when you use a custom measurement instrument built using standard rather than specialist parts. 4. Multiple instruments required A multimeter is commonly used to measure the averaged “sleep state” current, while the “active state” current can be captured using an oscilloscope. The total power and current consumptions must be manually estimated from these results, but the data is not always reliable and it can be time consuming to validate it. As shown in Figure 2, engineers and researchers need a wideband low-level current waveform measurement solution with a single instrument, simultaneously meeting multiple key measurement requirements. Figure 1. Current waveform measurements: limited dynamic range, large measurement noise and limited bandwidth Time Figure 2. Expected key requirements for wide- band low-level current waveform measurements. Time High speed sampling Wide bandwidth Wide dynamic range Low noise floor |
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