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TPD3S716-Q1 数据表(PDF) 4 Page - Texas Instruments

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部件名 TPD3S716-Q1
功能描述  Automotive USB 2.0 Interface Protection with Adjustable Current Limit and Short-to-Battery, Short-Circuit Protection
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TPD3S716-Q1 数据表(HTML) 4 Page - Texas Instruments

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TPD3S716-Q1
SLVSDH9C – MARCH 2016 – REVISED JUNE 2016
www.ti.com
Product Folder Links: TPD3S716-Q1
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
The algebraic convention, whereby the most negative value is a minimum and the most positive value is a maximum.
(3)
Thermal limits and power dissipation limits must be observed.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1) (2)
MIN
MAX
UNIT
VBUS_CON
Supply voltage from USB connector
–0.3
18
V
VBUS_SYS
Internal Supply DC voltage Rail on the PCB
–0.3
6
V
VD+, VD–
Voltage range from connector-side USB data lines
–0.3
18
V
D+, D–
Voltage range for internal USB data lines
–0.3
VIN + 0.3
V
VIN
Voltage range for VIN supply input
–0.3
4
V
DEN
Voltage on enable pins
7
V
VEN
7
V
IBUS
Maximum DC output current on VBUS_CON pin
(3)
2.4
A
VIADJ
Voltage range for IADJ pin
–0.3
VVBUS_SYS +
0.3
V
VFLT
Voltage range for the FLT pin
–0.3
7
V
TA
Operating free air temperature(3)
–40
125
°C
TSTG
Storage temperature
–65
150
°C
(1)
AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.
6.2 ESD Ratings—AEC Specification
VALUE
UNIT
V(ESD)
Electrostatic discharge
Human-body model (HBM), per AEC Q100-002(1)
±4000
V
Charged-device model (CDM), per AEC Q100-011
±1500
(1)
See Figure 20 for details on system level ESD testing setup.
6.3 ESD Ratings—IEC Specification
VALUE
UNIT
V(ESD)
Electrostatic discharge
IEC 61000-4-2, VBUS_CON,
VD+, VD– pins
Contact discharge(1)
±8000
V
Air-gap discharge(1)
±15000
(1)
See Figure 20 for details on system level ESD testing setup.
6.4 ESD Ratings—ISO Specification
VALUE
UNIT
V(ESD)
Electrostatic discharge
ISO 10605 (330 pF, 330
Ω),
VBUS_CON, VD+, VD– pins
Contact discharge(1)
±8000
V
Air-gap discharge(1)
±15000
6.5 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
VBUS_CON
Supply voltage from USB connector
5.9
V
VBUS_SYS
Internal supply DC voltage Rail on the PCB
4.75
5.9
V
VD+, VD–
Voltage range from connector-side USB data lines
0
VIN + 0.3
V
D+, D–
Voltage range for internal USB data lines
0
VIN + 0.3
V
VIN
Voltage range for VIN supply
3
3.6
V


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