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TDA8591J 数据表(PDF) 9 Page - NXP Semiconductors |
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TDA8591J 数据表(HTML) 9 Page - NXP Semiconductors |
9 / 36 page 2002 Jan 14 9 Philips Semiconductors Preliminary specification 4 × 44 W into 4 Ω or 4 × 75 W into 2 Ω quad BTL car radio power amplifier TDA8591J 7.2 Diagnostic output (DIAG) The internal circuit of the diagnostic open-drain output is shown in Fig.7. A pull-up resistor is required if the diagnostic output is connected to a microcontroller. Figure 8 shows four possible solutions for fault diagnosis. Figures 8a and 8b show simple configurations. The output offset diagnostic cannot trigger the microcontroller because of the 4-diode stack, only the temperature, short-circuit and dynamic distortion diagnostic will give an input LOW level for the microcontroller. In Fig.8c, the diagnostic output is connected to an external level shifter. Now DIAG pin output can also generate an input LOW level for the microcontroller. Assuming that a microcontroller HIGH input level must be equal to, or greater than 2 V, the following equations are used to calculate values for resistors R1 and R2: VIN1 > 2 V and where: 5 V is the pull-up supply voltage Vd is the forward voltage of a diode (0.6 V) R1 and R2 are the resistors in the level shifter. Using both equations: thus R1 > 3.3 R2 Therefore, R1 can be 47 k Ω and R2 can be 10 kΩ. The level shifter shown in Fig.8d is used as a 2-bit analog-to-digital converter. With reference to Figs 7 and 8c, the truth table in Table 1 can be made: Table 1 Truth table. V IN1 5V 4 V d R2 5V 4 V d × – R1 R2 + ------------------------------- × – × – = R1 2R2 × 5V 4 V d 2 – × – ---------------------------------------- > HIGH TEMPERATURE OR SHORT-CIRCUIT OR DDD OFFSET IN1 IN2 no no 1 1 no yes 0 1 yes don’t care 0 0 handbook, halfpage MGT610 ≥1 DIAG PGND temperature diagnostic short-circuit diagnostic dynamic distortion detection output offset diagnostic Fig.7 Internal circuit diagnostic output pin DIAG. |
类似零件编号 - TDA8591J |
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类似说明 - TDA8591J |
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