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LF198JAN-SP 数据表(PDF) 3 Page - Texas Instruments |
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LF198JAN-SP 数据表(HTML) 3 Page - Texas Instruments |
3 / 21 page LF198JAN www.ti.com SNOSAJ2A – FEBRUARY 2005 – REVISED MARCH 2013 These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. Absolute Maximum Ratings (1) Supply Voltage ±18V Power Dissipation (Package Limitation)(2) 500 mW Operating Ambient Temperature Range −55°C ≤TA ≤ +125°C Storage Temperature Range −65°C to +150°C Maximum Junction Temperature (TJmax) +150°C Input Voltage Equal to Supply Voltage Logic To Logic Reference Differential Voltage(3) +7V, −30V Output Short Circuit Duration Indefinite Hold Capacitor Short Circuit Duration 10 sec Lead Temperature (Soldering, 10 sec.) 300°C TO-99 (Still Air @ 0.5W) 160°C/W θJA Thermal Resistance TO-99 (500 LF/Min Air Flow @ 0.5W) 84°C/W θJC TO-99 48°C/W ESD Tolerance(4) 500V (1) “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensured specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions (2) The maximum power dissipation must be derated at elevated temperatures and is dictated by TJMAX, θJA, and the ambient temperature, TA. The maximum allowable power dissipation at any temperature is PD = (TJMAX − TA)/θJA, or the number given in the Absolute Maximum Ratings, whichever is lower. . (3) Although the differential voltage may not exceed the limits given, the common-mode voltage on the logic pins may be equal to the supply voltages without causing damage to the circuit. For proper logic operation, however, one of the logic pins must always be at least 2V below the positive supply and 3V above the negative supply. (4) Human body model, 100pF discharged through 1.5K Ω Quality Conformance Inspection Mil-Std-883, Method 5005 — Group A Subgroup Description Temperature (°C) 1 Static tests at +25°C 2 Static tests at +125°C 3 Static tests at −55°C 4 Dynamic tests at +25°C 5 Dynamic tests at +125°C 6 Dynamic tests at −55°C 7 Functional tests at +25°C 8A Functional tests at +125°C 8B Functional tests at −55°C 9 Switching tests at +25°C 10 Switching tests at +125°C 11 Switching tests at −55°C Copyright © 2005–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LF198JAN |
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