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AM26C32ID 数据表(PDF) 7 Page - Texas Instruments |
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AM26C32ID 数据表(HTML) 7 Page - Texas Instruments |
7 / 30 page TEST CIRCUIT Device Under Test G Input G Input VCC S1 RL = 1 kΩ CL = 50 pF (see Note A) VID = ±2.5 V VOLTAGE WAVEFORMS tPZL, tPLZ Measurement: S1 to VCC tPZH, tPHZ Measurement: S1 to GND 1.3 V G G (see Note B) Output (with VID = 2.5 V) Output (with VID = −2.5 V) tPZH tPHZ tPZH tPHZ tPZL tPLZ tPZL tPLZ VOH −0.5 V VOL + 0.5 V VOH −0.5 V VOL + 0.5 V 3 V 0 V 3 V 0 V VOH VOL VOH VOL 1.3 V 50% 50% A Input B Input TEST CIRCUIT VOLTAGE WAVEFORMS 0 V Output VOH VOL 10% 90% 90% 10% tTLH tTHL tPLH tPHL 2.5 V −2.5 V 50% Input Device Under Test A B VCC CL = 50 pF (see Note A) Input AM26C32 www.ti.com SLLS104K – DECEMBER 1990 – REVISED JUNE 2015 7 Parameter Measurement Information A. CL includes probe and jig capacitance. Figure 2. Switching Test Circuit and Voltage Waveforms A. CL includes probe and jig capacitance. B. The input pulse is supplied by a generator having the following characteristics: PRR = 1 MHz, duty cycle ≤ 50%, tr = tf = 6 ns. Figure 3. Enable/Disable Time Test Circuit and Output Voltage Waveforms Copyright © 1990–2015, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: AM26C32 |
类似零件编号 - AM26C32ID |
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类似说明 - AM26C32ID |
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