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IRF830PBF 数据表(PDF) 5 Page - Thinki Semiconductor Co., Ltd. |
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IRF830PBF 数据表(HTML) 5 Page - Thinki Semiconductor Co., Ltd. |
5 / 6 page Fig 13. Switching Time Test Circuit & Waveforms Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms Fig. 12. Gate Charge Test Circuit & Waveforms 10V Pulse Generator RG VDSS RL DUT VDD ( O.5 rated VDD ) VDS Vin 90% 10% td(on) td(off) t(on) t(off) tr tf 12V 200nF 50K DUT 300nF 1mA VDS Same as DUT VGS 12V 200nF 50K DUT 300nF 1mA VDS Same as DUT VGS V GS Qg Qgs Qgd Charge 10V V GS Qg Qgs Qgd Charge 10V 10V RG DUT L VDS 10V RG DUT L VDS IAS BVDSS ID(t) VDS (t) tp Eas = 1 2 LIAS 2 BVDSS -VDD BVDSS IAS BVDSS ID(t) VDS (t) tp Eas = 1 2 LIAS 2 BVDSS -VDD BVDSS © 2006 Thinki Semiconductor Co., Ltd. http://www.thinkisemi.com/ Page 5/6 Rev.05 ® IRF830PBF |
类似零件编号 - IRF830PBF |
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类似说明 - IRF830PBF |
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