4

Stock No. 23003-03 4/99

ES62UL256 Family

NanoAmp Solutions

TABLE 5: Capacitance

TABLE 6: Timing Test Conditions (Over the Specified Temperature Range)

TABLE 7: Read Cycle Timing

TABLE 8: Write Cycle Timing

Item

Symbol

Test Condition

Min

Max

Unit

Input Capacitance

5

pF

I/O Capacitance

5

pF

Item

Input Pulse Level

Input Rise and Fall Time

5nS

Input and Output Timing Reference Levels

Output Load

CL = 50pF

Item

Symbol

Min/Max

1.5V

3.0-3.6V

Units

-45

-25

Read Cycle Time

Min

200

45

25

ns

Address Access Time

Max

200

45

25

ns

Chip Enable Access Time

Max

200

45

25

ns

Output Enable to Valid Output

Max

60

15

10

ns

Chip Enable to Low-Z output

Min

20

5

5

ns

Output Enable to Low-Z Output

Min

20

5

5

ns

Chip Enable to High-Z Output

Min

0

0

0

ns

Max

50

15

10

Output Disable to High-Z Output

Min

0

0

0

ns

Max

50

15

10

Output Hold from Address Change

Min

20

5

5

ns

Item

Symbol

Min/Max

1.5V

3.0-3.6V

Unit

-45

-25

Write Cycle Time

Min

200

45

25

ns

Chip Enable to End of Write

Min

100

35

20

ns

Address Valid to End of Write

Min

100

35

20

ns

Address Set-Up Time

Min

0

0

0

ns

Write Pulse Width

Min

75

25

15

ns

Write Recovery Time

Min

0

0

0

ns

Write to High-Z Output

Min

0

0

0

ns

Max

60

20

15

Data to Write Time Overlap

Min

60

25

15

ns

Data Hold from Write Time

Min

0

0

0

ns

End Write to Low-Z Output

Min

20

5

5

ns