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STD16N60M2 数据表(PDF) 8 Page - STMicroelectronics |
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STD16N60M2 数据表(HTML) 8 Page - STMicroelectronics |
8 / 16 page Test circuits STD16N60M2 8/16 DocID027191 Rev 2 3 Test circuits Figure 14: Switching times test circuit for resistive load Figure 15: Gate charge test circuit Figure 16: Test circuit for inductive load switching and diode recovery times Figure 17: Unclamped inductive load test circuit Figure 18: Unclamped inductive waveform Figure 19: Switching time waveform AM01469v 1 VDD 47 k Ω 1 k Ω 47 k Ω 2.7 k Ω 1 k Ω 12 V Vi ≤ VGS 2200 μ F PW I G = CONST 100 Ω 100 nF D.U.T. VG AM01470v1 A D D.U.T. S B G 25 A A B B RG G FAST DIODE D S L=100 µH µF 3.3 1000 µF VDD Ω D.U.T. V (BR)DSS V DD V DD V D I DM I D AM01472v 1 AM01473v 1 0 V GS 90% V DS t on 90% 10% 90% 10% t d(on) t r t t d(off) t f 10% 0 off |
类似零件编号 - STD16N60M2 |
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类似说明 - STD16N60M2 |
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