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54ACTQ657 数据表(PDF) 7 Page - National Semiconductor (TI) |
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54ACTQ657 数据表(HTML) 7 Page - National Semiconductor (TI) |
7 / 10 page DC Characteristics for ’ACTQ Family Devices (Continued) 54ACTQ Symbol Parameter V CC T A = Units Conditions (V) −55˚C to +125˚C Guaranteed Limits I OLD Minimum Dynamic Output Current (Note 3) 5.5 50 mA V OLD = 1.65V Max I OHD 5.5 −50 mA V OHD = 3.85V Min I CC Maximum V IN = VCC Quiescent Supply 5.5 160.0 µA or GND (Note 4) Current V OLP Quiet Output Maximum 5.0 1.5 V (Note 5) Dynamic V OL V OLV Quiet Output Minimum 5.0 -1.2 V (Note 5) Dynamic V OL Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: ICC for 54ACTQ @ 25˚C is identical to 74ACTQ @ 25˚C. Note 5: Max number of outputs defined as (n). n−1 Data Inputs are driven 0V to 3V; one output @ GND. www.national.com 7 |
类似零件编号 - 54ACTQ657 |
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类似说明 - 54ACTQ657 |
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