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LF412JAN 数据表(PDF) 3 Page - Texas Instruments |
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LF412JAN 数据表(HTML) 3 Page - Texas Instruments |
3 / 17 page LF412JAN www.ti.com SNOSAQ7A – DECEMBER 2010 – REVISED MARCH 2013 Quality Conformance Inspection Table 1. Mil-Std-883, Method 5005 - Group A Subgroup Description Temp (°C) 1 Static tests at +25 2 Static tests at +125 3 Static tests at -55 4 Dynamic tests at +25 5 Dynamic tests at +125 6 Dynamic tests at -55 7 Functional tests at +25 8A Functional tests at +125 8B Functional tests at -55 9 Switching tests at +25 10 Switching tests at +125 11 Switching tests at -55 12 Settling time at +25 13 Settling time at +125 14 Settling time at -55 Copyright © 2010–2013, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Links: LF412JAN Not Recommended For New Designs |
类似零件编号 - LF412JAN_13 |
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类似说明 - LF412JAN_13 |
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