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FQP8N80C 数据表(PDF) 7 Page - Fairchild Semiconductor |
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FQP8N80C 数据表(HTML) 7 Page - Fairchild Semiconductor |
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7 / 10 page  Rev. A, March 2003 ©2003 Fairchild Semiconductor Corporation Peak Diode Recovery dv/dt Test Circuit & Waveforms DUT V DS + _ Driver R G Same Type as DUT VGS • dv/dt controlled by R G •I SD controlled by pulse period VDD L I SD 10V V GS ( Driver ) I SD ( DUT ) V DS ( DUT ) VDD Body Diode Forward Voltage Drop VSD I FM , Body Diode Forward Current Body Diode Reverse Current IRM Body Diode Recovery dv/dt di/dt D = Gate Pulse Width Gate Pulse Period -------------------------- DUT V DS + _ Driver R G Same Type as DUT VGS • dv/dt controlled by R G •I SD controlled by pulse period VDD L L I SD 10V V GS ( Driver ) I SD ( DUT ) V DS ( DUT ) VDD Body Diode Forward Voltage Drop VSD I FM , Body Diode Forward Current Body Diode Reverse Current IRM Body Diode Recovery dv/dt di/dt D = Gate Pulse Width Gate Pulse Period -------------------------- D = Gate Pulse Width Gate Pulse Period -------------------------- |
类似零件编号 - FQP8N80C |
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类似说明 - FQP8N80C |
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