LM35

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SNIS159D – AUGUST 1999 – REVISED OCTOBER 2013

ELECTRICAL CHARACTERISTICS

(1)(2) (continued)

LM35

LM35C, LM35D

UNITS

PARAMETER

TEST CONDITIONS

TYP

TESTED

DESIGN

TYP

TESTED

DESIGN

(MAX.)

56

80

56

80

105

158

91

138

µA

56.2

82

56.2

82

105.5

161

91.5

141

4 V

0.2

2

0.2

2

Change of quiescent

µA

4 V

0.5

3

0.5

3

Temperature

+0.39

+0.7

+0.39

+0.7

coefficient of

µA/°C

quiescent current

Minimum temperature

+1.5

+2

+1.5

+2

°C

for rate accuracy

Long term stability

±0.08

±0.08

°C

(8)

Quiescent current is defined in the circuit of Figure 1.

(9)

Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating

effects can be computed by multiplying the internal dissipation by the thermal resistance.

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