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LM2675N-5.0 数据表(PDF) 10 Page - Texas Instruments |
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LM2675N-5.0 数据表(HTML) 10 Page - Texas Instruments |
10 / 30 page LM2675 SNVS129E – MAY 2004 – REVISED JUNE 2005 www.ti.com Test Circuit and Layout Guidelines CIN - 22 μF, 50V Tantalum, Sprague “199D Series” COUT - 47 μF, 25V Tantalum, Sprague “595D Series” D1 - 3.3A, 50V Schottky Rectifier, IR 30WQ05F L1 - 68 μH Sumida #RCR110D-680L CB - 0.01 μF, 50V Ceramic Figure 22. Standard Test Circuits and Layout Guides Fixed Output Voltage Versions CIN - 22 μF, 50V Tantalum, Sprague “199D Series” COUT - 47 μF, 25V Tantalum, Sprague “595D Series” D1 - 3.3A, 50V Schottky Rectifier, IR 30WQ05F L1 - 68 μH Sumida #RCR110D-680L R1 - 1.5 k Ω, 1% CB - 0.01 μF, 50V Ceramic For a 5V output, select R2 to be 4.75 k Ω, 1% where VREF = 1.21V Use a 1% resistor for best stability. Figure 23. Standard Test Circuits and Layout Guides Adjustable Output Voltage Version 10 Submit Documentation Feedback Copyright © 2004–2005, Texas Instruments Incorporated Product Folder Links: LM2675 |
类似零件编号 - LM2675N-5.0 |
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类似说明 - LM2675N-5.0 |
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