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AD7524SE 数据表(PDF) 3 Page - Analog Devices |
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AD7524SE 数据表(HTML) 3 Page - Analog Devices |
3 / 8 page AD7524 REV. B –3– ABSOLUTE MAXIMUM RATINGS* (TA = +25°C, unless otherwise noted) VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V VRFB to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 V VREF to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±25 V Digital Input Voltage to GND . . . . . . . . –0.3 V to VDD +0.3 V OUT1, OUT2 to GND . . . . . . . . . . . . . –0.3 V to VDD +0.3 V Power Dissipation (Any Package) To +75 °C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 450 mW Derates above 75 °C by . . . . . . . . . . . . . . . . . . . . 6 mW/°C Operating Temperature Commercial (J, K, L) . . . . . . . . . . . . . . . . . –40 °C to +85°C Industrial (A, B, C) . . . . . . . . . . . . . . . . . . –40 °C to +85°C Extended (S, T, U) . . . . . . . . . . . . . . . . . –55 °C to +125°C Storage Temperature . . . . . . . . . . . . . . . . . . –65 °C to +150°C Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300 °C *Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. WARNING! ESD SENSITIVE DEVICE CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7524 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. TERMINOLOGY RELATIVE ACCURACY: A measure of the deviation from a straight line through the end points of the DAC transfer function. Normally expressed as a percentage of full scale range. For the AD7524 DAC, this holds true over the entire VREF range. RESOLUTION: Value of the LSB. For example, a unipolar con- verter with n bits has a resolution of (2 –n) (V REF). A bipolar con- verter of n bits has a resolution of [2 –(n–1)] [V REF]. Resolution in no way implies linearity. GAIN ERROR: Gain Error is a measure of the output error be- tween an ideal DAC and the actual device output. It is measured with all 1s in the DAC after offset error has been adjusted out and is expressed in LSBs. Gain Error is adjustable to zero with an external potentiometer. FEEDTHROUGH ERROR: Error caused by capacitive cou- pling from VREF to output with all switches OFF. OUTPUT CAPACITANCE: Capacity from OUT1 and OUT2 terminals to ground. OUTPUT LEAKAGE CURRENT: Current which appears on OUT1 terminal with all digital inputs LOW or on OUT2 terminal when all inputs are HIGH. This is an error current which contributes an offset voltage at the amplifier output. PIN CONFIGURATIONS DIP, SOIC PLCC LCCC |
类似零件编号 - AD7524SE |
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类似说明 - AD7524SE |
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