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DAC08Q 数据表(PDF) 5 Page - Analog Devices |
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DAC08Q 数据表(HTML) 5 Page - Analog Devices |
5 / 20 page DAC08 Rev. C | Page 5 of 20 ABSOLUTE MAXIMUM RATINGS Table 3. Parameter Rating Operating Temperature DAC08AQ, DAC08Q −55°C to +125°C DAC08HQ, DAC08EQ, DAC08CQ, DAC08HP, DAC08EP 0°C to +70°C DAC08CP, DAC08CS −40°C to +85°C Junction Temperature (TJ) −65°C to +150°C Storage Temperature Q Package −65°C to +150°C Storage Temperature P Package −65°C to +125°C Lead Temperature (Soldering, 60 sec) 300°C V+ Supply to V− Supply 36 V Logic Inputs V− to V− + 36 V VLC V− to V+ Analog Current Outputs (at VS− = 15 V) 4.25 mA Reference Input (V14 to V15) V− to V+ Reference Input Differential Voltage (V14 to V15) ±18 V Reference Input Current (I14) 5.0 mA Package Type θJA1 θJC Unit 16-Lead CERDIP (Q) 100 16 °C/W 16-Lead PDIP (P) 82 39 °C/W 20-Terminal LCC (RC) 76 36 °C/W 16-Lead SOIC (S) 111 35 °C/W 1 θJA is specified for worst-case mounting conditions, that is, θJA is specified for device in socket for CERDIP, PDIP, and LCC packages; θJA is specified for device soldered to printed circuit board for SOIC package. Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. |
类似零件编号 - DAC08Q |
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类似说明 - DAC08Q |
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