DAC161S997 datasheet(5/27 Pages) TI

部件名	DAC161S997

功能描述	16-bit SPI Programmable DAC for 4-20mA Loops

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制造商	TI [Texas Instruments]

网页	http://www.ti.com

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5 / 27 page

DAC161S997

www.ti.com

SNAS621 – JUNE 2013

ELECTRICAL CHARACTERISTICS

Unless otherwise noted, these specifications apply for VA = VD = 3.3 V, COMA = COMD = 0 V, TA= 25°C, external bipolar

transistor: 2N3904, RE = 22

Ω, C1 = C2 = C3 = 2.2 nF. Boldface limits are over the temperature range of –40°C ≤ TA ≤

105°C

PARAMETER

TEST CONDITIONS

MIN(1)

TYP

MAX(1)

UNIT

POWER SUPPLY

VA, VD

Supply voltage

VA = VD

2.7

3.6

V

VA supply current

DACCODE = 0x0200(2)

43

µA

VD supply current

57

µA

ICC

Total supply current

100

125

µA

DC ACCURACY

N

Resolution

16

bits

INL

Integral non-linearity(3)

0x2AAA < DACCODE < 0xD555

–1.5

2.6

µA

(4 mA < ILOOP < 20 mA)

DNL

Differential non-linearity

see (4)

–0.2

0.2

µA

TUE

Total unadjusted error

0x2AAA < DACCODE < 0xD555

0.01

%FS

OE

Offset error

see (5)

–7.86

0.84

7.86

µA

ΔOE

Offset error temperature coefficient

-40°C

≤ TA ≤ 105°C

0.48

ppmFS/°C

GE

Gain error

see (6)

0.007

%FS

ΔGE

Gain error temperature coefficient

-40°C

≤ TA ≤ 105°C

5

ppmFS/°C

IERRL

LOW ERROR current

ERR_LOW = default

3.36

3.375

3.39

mA

IERRH

HIGH ERROR current

ERR_HIGH = default

21.70

21.75

21.82

mA

LTD

Long term drift — mean shift of 12

90

ppmFS

mA output current after 1000 hours

at 150°C

LOOP CURRENT OUTPUT (OUT)

IOUTMIN

Minimum output current

Tested at DACCODE = 0x01C2(7)

0.19

mA

IOUTMAX

Maximum output current

Tested at DACCODE = 0xFFFF

23.95

mA

ROUT

Output impedance

200

M

Ω

COMA to OUT voltage drop

IOUT = 24 mA

960

mV

BASE OUTPUT

IOUTSC

BASE short circuit output current

BASE forced to COMA potential

10

mA

DYNAMIC CHARACTERISTICS

Output noise density

1 kHz

20

nA/rtHz

Integrated output noise

1 Hz to 1 kHz band

300

nARMS

INTERNAL TIMER

TM

Timeout period

Default setting of TIMEOUT in

100

ms

CONFIG register

DIGITAL INPUT CHARACTERISTICS

IIN

Digital input leakage current

–10

10

µA

VIL

Input low voltage

0.2 × VD

V

VIH

Input high voltage

0.7 × VD

V

CIN

Input capacitance

5

pF

(1)

Limits are ensured by testing, design, or statistical analysis at 25°C. Limits over the operating temperature range are ensured through

correlations using statistical quality control (SQC) method.

(2)

At code 0x0200 the BASE current is minimal, for example, device current contribution to power consumption is minimized. SPI is

inactive, for example, after transmitting code 0x200 to the DAC161S997, there are no more transitions in the channel during the supply

current measurement.

(3)

INL is measured using the best-fit method in the output current range of 4 mA to 20 mA.

(4)

Specified by design.

(5)

Offset is the y-intercept of the straight line defined by 4 mA and 20 mA points of the measured transfer characteristic.

(6)

Gain Error is the difference in slope of the straight line defined by measured 4 mA and 20 mA points of transfer characteristic, and that

of the ideal characteristic.

(7)

This must be treated as the minimum LOOP current ensured in self-powered mode.

5

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