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FQD3N60 数据表(PDF) 5 Page - Fairchild Semiconductor |
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FQD3N60 数据表(HTML) 5 Page - Fairchild Semiconductor |
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5 / 9 page  ©2000 Fairchild Semiconductor International Rev. A, April 2000 Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50K 200nF 12V Same Type as DUT Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50K 200nF 12V Same Type as DUT VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS EAS =L IAS 2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS 2 ---- 2 1 EAS =L IAS 2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L L I D I D t p |
类似零件编号 - FQD3N60 |
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类似说明 - FQD3N60 |
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