4

www.fairchildsemi.com

www.fairchildsemi.com

FM27C010

AC Test Conditions

Output Load

1 TTL Gate and C

Input Rise and Fall Times

≤5 ns

Input Pulse Levels

0.45V to 2.4V

Timing Measurement Reference Level

Inputs

0.8V and 2V

Outputs

0.8V and 2V

Note 1: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of

the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions

for extended periods may affect device reliability.

Note 2: This parameter is only sampled and is not 100% tested.

Note 3: OE may be delayed up to t

Note 5: TRI-STATE may be attained using OE or CE.

Note 6: The power switching characteristics of EPROMs require careful device decoupling. It is recommended that at least a 0.1

µF ceramic capacitor be used on every device

Note 7: The outputs must be restricted to V

Note 8: 1 TTL Gate: I

C

Note 9: V

Note 10: Inputs and outputs can undershoot to -2.0V for 20 ns Max.

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Address Setup Time

1

µs

t

OES

OE Setup Time

1

µs

CE Setup Time

1

µs

t

DS

Data Setup Time

1

µs

1

µs

t

VCS

V

1

µs

Address Hold Time

0

µs

t

DH

Data Hold Time

1

µs

Output Enable to Output Float Delay

060

ns

t

PW

Program Pulse Width

45

50

105

µs

Address Valid

Valid Output

Hi-Z

2V

0.8V

2V

0.8V

2V

0.8V

ADDRESS

OUTPUT

CE

OE

2V

0.8V

(Note 3)

(Note 3)

(Note 4, 5)

(Note 4, 5)

Hi-Z

DS800032-4