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HCPL0638 数据表(PDF) 5 Page - Fairchild Semiconductor |
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HCPL0638 数据表(HTML) 5 Page - Fairchild Semiconductor |
5 / 18 page ©2006 Fairchild Semiconductor Corporation www.fairchildsemi.com HCPL06XX Rev. 1.0.8 5 Transfer Characteristics (TA = -40°C to +85°C unless otherwise specified.) Isolation Characteristics (TA = -40°C to +85°C unless otherwise specified.) *All typical values are at VCC = 5 V, TA = 25°C Notes: 1. The VCC supply to each optoisolator must be bypassed by a 0.1µF capacitor or larger. This can be either a ceramic or solid tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package VCC and GND pins of each device. 2. Enable Input – No pull up resistor required as the device has an internal pull up resistor. 3. tPLH – Propagation delay is measured from the 3.75mA level on the HIGH to LOW transition of the input current pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 4. tPHL – Propagation delay is measured from the 3.75mA level on the LOW to HIGH transition of the input current pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 5. tr – Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse. 6. tf – Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse. 7. tELH – Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse to the 1.5V level on the LOW to HIGH transition of the output voltage pulse. 8. tEHL – Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse to the 1.5V level on the HIGH to LOW transition of the output voltage pulse. 9. CMH – The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e., VOUT > 2.0V). Measured in volts per microsecond (V/µs). 10. CML – The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state (i.e., VOUT < 0.8V). Measured in volts per microsecond (V/µs). 11. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together, and Pins 5, 6, 7 and 8 shorted together. Symbol DC Characteristics Test Conditions Min. Typ.* Max. Unit IOH High Level Output Current VCC = 5.5V, VO = 5.5 V, IF = 250µA, VE = 2.0V (2) 100 µA VOL Low Level Output Voltage VCC = 5.5V, IF = 5mA, VE = 2.0V, IOL = 13mA (2) 0.6 V IFT Input Threshold Current VCC = 5.5V, VO = 0.6V, VE = 2.0V, IOL = 13mA 5mA Symbol Characteristics Test Conditions Min. Typ.* Max. Unit II-O Input-Output Insulation Leakage Current Relative humidity = 45%, TA = 25°C, t = 5s, VI-O = 3000 VDC (11) 1.0* µA VISO Withstand Insulation Test Voltage RH < 50%, TA = 25°C, II-O ≤ 2µA, t = 1 min. (11) 3750 VRMS RI-O Resistance (Input to Output) VI-O = 500V (11) 1012 Ω CI-O Capacitance (Input to Output) f = 1MHz(11) 0.6 pF |
类似零件编号 - HCPL0638_09 |
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类似说明 - HCPL0638_09 |
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