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OP193 数据表(PDF) 5 Page - Analog Devices

部件名 OP193
功能描述  Precision, Micropower Operational Amplifiers
Download  16 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

OP193 数据表(HTML) 5 Page - Analog Devices

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ELECTRICAL SPECIFICATIONS
“E” Grade
“F” Grade
Parameter
Symbol
Conditions
Min Typ
Max
Min Typ
Max
Units
INPUT CHARACTERISTICS
Offset Voltage
VOS
OP193
75
150
µV
OP193, –40
°C ≤ T
A
≤ +125°C
175
250
µV
OP293
100
250
µV
OP293, –40
°C ≤ T
A
≤ +125°C
175
350
µV
OP493
125
275
µV
OP493, –40
°C ≤ T
A
≤ +125°C
225
375
µV
Input Bias Current
IB
–40
°C ≤ T
A ≤ +125°C15
20
nA
Input Offset Current
IOS
–40
°C ≤ T
A
≤ +125°C2
4
nA
Input Voltage Range
VCM
01
01
V
Large Signal Voltage Gain
AVO
RL = 100 k
Ω, 0.03 ≤ V
OUT
≤ 1 V
60
60
V/mV
–40
°C ≤ T
A ≤ +125°C
70
70
V/mV
Long Term Offset Voltage
VOS
Note 1
150
300
µV
POWER SUPPLY
Power Supply Rejection Ratio
PSRR
VS = +1.7 V to +6 V,
100
97
–40
°C ≤ T
A ≤ +125°C
9490dB
Supply Current/Amplifier
ISY
VCM = 1.0 V, RL = ∞
13.2 20
13.2 20
µA
–40
°C ≤ T
A ≤ +125°C25
25
µA
Supply Voltage Range
VS
+2
±18
+2
±18
V
NOISE PERFORMANCE
Voltage Noise Density
en
f = 1 kHz
65
65
nV/
√Hz
Current Noise Density
in
f = 1 kHz
0.05
0.05
pA/
√Hz
Voltage Noise
en p-p
0.1 Hz to 10 Hz
3
3
µV p-p
DYNAMIC PERFORMANCE
Slew Rate
SR
RL = 2 kΩ
10
10
V/ms
Gain Bandwidth Product
GBP
25
25
kHz
WAFER TEST LIMITS
Parameter
Symbol
Conditions
Limit
Units
Offset Voltage
VOS
VS =
±15 V, V
OUT = 0 V
±75
µV max
VS = +2 V, VOUT = 1.0 V
±75
µV max
Input Bias Current
IB
VCM = 1.0 V
20
nA max
Input Offset Current
IOS
VCM = 1.0 V
4
nA max
Input Voltage Range
1
VCM
0 to 4
V min
Common-Mode Rejection
CMRR
0
≤ V
CM
≤ 4 V
96
dB min
Power Supply Rejection Ratio
PSRR
VS =
±1.5 V to ±18 V
100
dB min
Large Signal Voltage Gain
AVO
RL = 100 kΩ
100
V/mV min
Output Voltage Swing High
VOH
IL = 1 mA
4.1
V min
Output Voltage Swing Low
VOL
IL = –1 mA
400
mV max
Supply Current/Amplifier
ISY
VO = 0 V, RL = ∞, VS = ± 18 V
25
µA max
NOTES
Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard
product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
1Guaranteed by CMRR test.
Specifications subject to change without notice.
(@ VS = +2.0 V, VCM = 0.1 V, TA = +25 C unless otherwise noted)
OP193/OP293/OP493
REV. A
–5–
(@ VS = +5.0 V, VCM = 0.1 V, VOUT = 2 V, TA = +25 C unless otherwise noted)


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