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ADE7757ARN 数据表(PDF) 4 Page - Analog Devices

部件名 ADE7757ARN
功能描述  Energy Metering IC with Integrated Oscillator
Download  14 Pages
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制造商  AD [Analog Devices]
网页  http://www.analog.com
标志 AD - Analog Devices

ADE7757ARN 数据表(HTML) 4 Page - Analog Devices

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PRELIMINARY TECHNICAL DATA
REV. PrC.
ADE7757
–4–
ABSOLUTE MAXIMUM RATINGS*
(TA = +25°C unless otherwise noted)
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Analog Input Voltage to AGND
V1P, V1N, V2P and V2N . . . . . . . . . . . . . . . –6 V to +6 V
Reference Input Voltage to AGND . . . –0.3 V to VDD + 0.3 V
Digital Input Voltage to DGND . . . . . –0.3 V to VDD + 0.3 V
Digital Output Voltage to DGND . . . . –0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (A, B Versions) . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . +150°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the ADE7757 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
16-Lead Plastic SOIC, Power Dissipation . . . . . . . . . 350mW
θ
JA Thermal Impedance**
. . . . . . . . . . . . . . . . . 124.9°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . +220°C
*Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device. This is a stress rating only; functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
**JEDEC 1S Standard (2 layer) Board Data
TERMINOLOGY
MEASUREMENT ERROR
The error associated with the energy measurement made by the
ADE7757 is defined by the following formula:
%
%
100
7757
×
=
Energy
True
Energy
True
ADE
by
registered
Energy
Error
PHASE ERROR BETWEEN CHANNELS
The HPF (High Pass Filter) in the current channel (Channel
V1) has a phase lead response. To offset this phase response
and equalize the phase response between channels, a phase
correction network is also placed in Channel V1. The phase
correction network matches the phase to within ±0.1° over a
range of 45 Hz to 65 Hz and ±0.2° over a range 40 Hz to 1
kHz. See Figures 19 and 20.
POWER SUPPLY REJECTION
This quantifies the ADE7757 measurement error as a percent-
age of reading when the power supplies are varied.
For the ac PSR measurement a reading at nominal supplies
(5 V) is taken. A 200 mV rms/100 Hz signal is then introduced
onto the supplies and a second reading obtained under the
same input signal levels. Any error introduced is expressed as a
percentage of reading—see Measurement Error definition.
For the dc PSR measurement a reading at nominal supplies
(5 V) is taken. The supplies are then varied ±5% and a second
reading is obtained with the same input signal levels. Any error
introduced is again expressed as a percentage of reading.
ADC OFFSET ERROR
This refers to the small dc signal (offset) associated with the
analog inputs to the ADCs. However, the HPF in Channel V1
eliminates the offset in the circuitry. Therefore, the power cal-
culation is not affected by this offset.
FREQUENCY OUTPUT ERROR
The frequency output error of the ADE7757 is defined as
the difference between the measured output frequency (mi-
nus the offset) and the ideal output frequency. The differ-
ence is expressed as a percentage of the ideal frequency.
The ideal frequency is obtained from the ADE7757 trans-
fer function—see Transfer Function section.
GAIN ERROR
The gain error of the ADE7757 is defined as the differ-
ence between the measured output frequency (minus the
offset) and the ideal output frequency. It is measured with
a gain of 1 in channel V1. The difference is expressed as a
percentage of the ideal frequency. The ideal frequency is
obtained from the ADE7757 transfer function—see Trans-
fer Function section.
WARNING!
ESD SENSITIVE DEVICE


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