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CXA1386P 数据表(PDF) 10 Page - Sony Corporation |
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CXA1386P 数据表(HTML) 10 Page - Sony Corporation |
10 / 21 page – 10 – CXA1386P/K Power Supply Current Test Circuit Analog input bias current test circuit CXA1386P A A 22 23 24 25 26 27 28 15 16 17 18 19 20 21 2 3 4 5 6 7 8 9 10 11 12 13 14 1 IIN IEE –5.2V –1V –2V 8 9 10 11 12 13 14 15 16 17 CXA1386K 7 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 39 40 41 42 43 44 1 2 3 4 5 6 –2V A –1V IIN A IEE –5.2V Sampling delay test circuit Aperture jitter test circuit Aperture jitter test method CXA1386 P/K OSC1 φ: Variable OSC2 Logic Analizer 37.5MHz 37.5MHz Amp ECL Buffer CLK VIN 8 fr 1024 samples VIN σ (LSB) CLK VIN CLK t ∆v ∆t 0V –1V –2V 129 128 127 126 125 Aperture jitter Where σ (unit: LSB) is the deviation of the output codes when the input frequency is exactly the same as the clock and is sampled at the largest slew rate point. Taj = σ/ = σ/( ), ∆t ∆υ 2 256 × 2πf Aperture jitter is defined as follows: |
类似零件编号 - CXA1386P |
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类似说明 - CXA1386P |
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