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TSC2007-Q1 数据表(PDF) 2 Page - Texas Instruments

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部件名 TSC2007-Q1
功能描述  1.2V to 3.6V, 12-Bit, Nanopower, 4-Wire Micro TOUCH SCREEN CONTROLLER with I2C??Interface
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制造商  TI1 [Texas Instruments]
网页  http://www.ti.com
标志 TI1 - Texas Instruments

TSC2007-Q1 数据表(HTML) 2 Page - Texas Instruments

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PENIRQ
I C
Serial
Interface
and
Control
2
SCL
SDA
A[0:1]
X+
X-
Y+
Y-
AUX
TEMP
Mux
VDD/REF
GND
SAR
ADC
Internal
Clock
Touch
Screen
Drivers
Interface
TSC2007-Q1
SBAS545
– SEPTEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
TA
PACKAGE
ORDERABLE PART NUMBER
TOP-SIDE MARKING
–40°C to +85°C
TSSOP
– PW
Reel of 2000
TSC2007IPWRQ1
TS2007I
(1)
For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see
the TI website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
PARAMETER
VALUE
UNIT
Analog input X+, Y+, AUX to GND
–0.4 to VDD + 0.1
V
Voltage
Analog input X
–, Y– to GND
–0.4 to VDD + 0.1
V
Voltage range
VDD/REF pin to GND
–0.3 to +5
V
Digital input voltage to GND
–0.3 to VDD + 0.3
V
Digital output voltage to GND
–0.3 to VDD + 0.3
V
Power dissipation
(TJ Max - TA)/θJA
Thermal impedance,
θJA
TSSOP package
86
°C/W
Operating free-air temperature range, TA
–40 to +85
°C
Storage temperature range, TSTG
–65 to +150
°C
Junction temperature, TJ Max
+150
°C
Vapor phase (60 sec)
+215
°C
Lead temperature
Infrared (15 sec)
+220
°C
IEC contact discharge(2)
X+, X
–, Y+, Y–
±15
kV
IEC air discharge(2)
X+, X
–, Y+, Y–
±25
kV
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum rated conditions for extended periods may affect device reliability.
(2)
Test method based on IEC standard 61000-4-2. Contact Texas Instruments for test details.
2
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Copyright
© 2011, Texas Instruments Incorporated
Product Folder Link(s): TSC2007-Q1


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