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TS3DDR3812RUAR 数据表(PDF) 7 Page - Texas Instruments

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部件名 TS3DDR3812RUAR
功能描述  12-Channel, 1:2 MUX/DEMUX Switch for DDR3 Applications
Download  18 Pages
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制造商  TI [Texas Instruments]
网页  http://www.ti.com
标志 TI - Texas Instruments

TS3DDR3812RUAR 数据表(HTML) 7 Page - Texas Instruments

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CL
(see Note A)
TEST CIRCUIT
S1
2 × VDD
Open
GND
RL
RL
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics:PRR ≤10 MHz, ZO = 50 Ω, tr ≤ 2.5 ns, tf ≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. tPLZ and tPHZ are the same as tdis.
F. tPZL and tPZH are the same as ten.
50 Ω
VG1
VDD
DUT
50 Ω
VIN
50 Ω
VG2
50 Ω
VI
TEST
RL
S1
V
CL
VDD
Vin
tPLZ/tPZL
2 × VDD
200 Ω
GND
4 pF
0.3 V
Input Generator
Input Generator
VO
tPHZ/tPZH
GND
200 Ω
VDD
4 pF
0.3 V
tPZL
VOH - 0.3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
VCC/2
VDC/2
Output Control
(VIN)
VOH
VOL + 0.3 V
VOH
VOL
0 V
tPZH
tPLZ
tPHZ
Output
Waveform 2
S1 at GND
(see Note B)
Output
Waveform 1
S1 at 2 x VCC
(see Note B)
VOL
VO
VSEL
VO
3.3 V ± 0.3 V
3.3 V ± 0.3 V
1.65 V
1.65 V
3.33 V
TS3DDR3812
www.ti.com
SCDS314A
– FEBRUARY 2011 – REVISED MARCH 2011
PARAMETER MEASUREMENT INFORMATION
Enable and Disable Times
Figure 5. Test Circuit and Voltage Waveforms
Copyright
© 2011, Texas Instruments Incorporated
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