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74HCT157 数据表(PDF) 10 Page - NXP Semiconductors |
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74HCT157 数据表(HTML) 10 Page - NXP Semiconductors |
10 / 18 page 74HC_HCT157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved. Product data sheet Rev. 3 — 31 December 2010 10 of 18 NXP Semiconductors 74HC157; 74HCT157 Quad 2-input multiplexer Test data is given in Table 9. Definitions test circuit: RT = Termination resistance should be equal to output impedance Zo of the pulse generator. CL = Load capacitance including jig and probe capacitance. RL = Load resistance. S1 = Test selection switch. Fig 9. Test circuit for measuring switching times 001aah768 tW tW tr tr tf VM VI negative pulse GND VI positive pulse GND 10 % 90 % 90 % 10 % VM VM VM tf VCC DUT RT VI VO CL G Table 9. Test data Type Input Load Test VI tr, tf CL 74HC157 VCC 6.0 ns 15 pF, 50 pF tPLH, tPHL 74HCT157 3.0 V 6.0 ns 15 pF, 50 pF tPLH, tPHL |
类似零件编号 - 74HCT157 |
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类似说明 - 74HCT157 |
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