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SI4431-B1-FM 数据表(PDF) 9 Page - Silicon Laboratories |
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SI4431-B1-FM 数据表(HTML) 9 Page - Silicon Laboratories |
9 / 74 page Si4430/31/32-B1 Rev 1.1 9 Table 3. Receiver AC Electrical Characteristics1 Parameter Symbol Conditions Min Typ Max Units RX Frequency Range—Si4431/32 FRX 240 — 930 MHz RX Frequency Range—Si4430 FRX 900 — 960 MHz RX Sensitivity2 PRX_2 (BER < 0.1%) (2 kbps, GFSK, BT = 0.5, f = 5kHz)3 — –121 — dBm PRX_40 (BER < 0.1%) (40 kbps, GFSK, BT = 0.5, f = 20 kHz)3 — –108 — dBm PRX_100 (BER < 0.1%) (100 kbps, GFSK, BT = 0.5, f = 50 kHz)3 — –104 — dBm PRX_125 (BER < 0.1%) (125 kbps, GFSK, BT = 0.5, f = 62.5 kHz) — –101 — dBm PRX_OOK (BER < 0.1%) (4.8 kbps, 350 kHz BW, OOK)3 —–110— dBm (BER < 0.1%) (40 kbps, 400 kHz BW, OOK)3 — –102 — dBm RX Channel Bandwidth3 BW 2.6 — 620 kHz BER Variation vs Power Level3 PRX_RES Up to +5 dBm Input Level — 0 0.1 ppm LNA Input Impedance3 (Unmatched—measured differentially across RX input pins) RIN-RX 915 MHz — 51–60j — 868 MHz — 54–63j — 433 MHz — 89–110j — 315 MHz — 107–137j — RSSI Resolution RESRSSI —±0.5— dB 1-Ch Offset Selectivity3 C/I1-CH Desired Ref Signal 3 dB above sensitivity, BER < 0.1%. Interferer and desired modu- lated with 40 kbps F = 20 kHz GFSK with BT = 0.5, channel spacing = 150 kHz —–31 — dB 2-Ch Offset Selectivity3 C/I2-CH —–35 — dB 3-Ch Offset Selectivity3 C/I3-CH —–40 — dB Blocking at 1 MHz Offset3 1MBLOCK Desired Ref Signal 3 dB above sensitivity. Interferer and desired modulated with 40 kbps F = 20 kHz GFSK with BT = 0.5 —–52 — dB Blocking at 4 MHz Offset3 4MBLOCK —–56 — dB Blocking at 8 MHz Offset3 8MBLOCK —–63 — dB Image Rejection3 ImREJ Rejection at the image frequency. IF=937 kHz —–30 — dB Spurious Emissions3 POB_RX1 Measured at RX pins — — –54 dBm Notes: 1. All specification guaranteed by production test unless otherwise noted. Production test conditions and max limits are listed in the "Production Test Conditions" section on page 14. 2. Receive sensitivity at multiples of 30 MHz may be degraded. If channels with a multiple of 30 MHz are required it is recommended to shift the crystal frequency. Contact Silicon Labs Applications Support for recommendations. 3. Guaranteed by qualification. Qualification test conditions are listed in the "Production Test Conditions" section on page 14. |
类似零件编号 - SI4431-B1-FM |
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类似说明 - SI4431-B1-FM |
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