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TL2844DRG4-8 数据表(PDF) 9 Page - Texas Instruments |
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TL2844DRG4-8 数据表(HTML) 9 Page - Texas Instruments |
9 / 21 page TL284x, TL384x CURRENT-MODE PWM CONTROLLERS SLVS038G − JANUARY 1989 − REVISED FEBRUARY 2008 9 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 APPLICATION INFORMATION DEAD TIME vs TIMING CAPACITANCE Figure 4 100 40 10 4 0 CT − Timing Capacitance − nF 100 40 10 4 1 0.4 0.1 VCC = 15 V RT ≥ 5 kΩ TA = 25°C TIMING RESISTANCE vs FREQUENCY Figure 5 100 1 k 10 k 100 k 1 M f − Frequency − Hz 100 40 10 4 1 VCC = 15 V TA = 25°C CT = 22 nF CT = 47 nF CT = 100 nF CT = 10 nF CT = 4.7 nF CT = 2.2 nF CT = 1 nF open-loop laboratory test fixture In the open-loop laboratory test fixture (see Figure 6), high peak currents associated with loads necessitate careful grounding techniques. Timing and bypass capacitors should be connected close to the GND terminal in a single-point ground. The transistor and 5-k Ω potentiometer sample the oscillator waveform and apply an adjustable ramp to the ISENSE terminal. 2N2222 4.7 k Ω 1 k Ω Error Amplifier Adjust 4.7 k Ω 5 k Ω ISENSE Adjust RT 100 k Ω COMP VFB ISENSE RT/CT REF OUTPUT GND VCC 0.1 µF 0.1 µF REF VCC OUTPUT GND 1 k Ω, 1 W A CT TL284x TL384x DUT Figure 6. Open-Loop Laboratory Test Fixture |
类似零件编号 - TL2844DRG4-8 |
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类似说明 - TL2844DRG4-8 |
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