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TLP113 数据表(PDF) 5 Page - Toshiba Semiconductor |
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TLP113 数据表(HTML) 5 Page - Toshiba Semiconductor |
5 / 8 page TLP113 2002-09-25 5 Test Circuit 1: Switching Time Test Circuit CL is approximately 15pF which includes probe and stray wiring capacitance. Test Circuit 2: Common Mode Transient Immunity Test Circuit s) µ ( f t 160(V) = L CΜ s) µ ( r t 160(V) = Η CΜ , CL is approximately 15pF which includes probe and stray wiring capacitance. 16mA 8mA 0mA 5V 4.5V 1.5V 0.5V VOL tpLH tpHL tf tr VO IF VO Output monitor VCC = 5V VCC GND CL Pulse input PW = 100µs Duty ratio = 1 / 10 IF monitor 200V 90% 0V 5V 2V 0.8V VOL tr tf VO VCM VO Output monitor VCC = 5V VCC GND CL Pulse gen ZO = 50Ω VCM IF 10% VO (IF = 10mA) (IF = 0mA) |
类似零件编号 - TLP113 |
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类似说明 - TLP113 |
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