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ADXL346BCCZ-RL 数据表(PDF) 3 Page - Analog Devices |
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ADXL346BCCZ-RL 数据表(HTML) 3 Page - Analog Devices |
3 / 32 page Preliminary Technical Data ADXL346 Rev. PrC | Page 3 of 32 SPECIFICATIONS TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 F tantalum, CIO = 0.1 F, ODR = 800 Hz, unless otherwise noted. Table 1. Specifications1 Parameter Test Conditions Min Typ Max Unit SENSOR INPUT Each axis Measurement Range User selectable ±2, ±4, ±8, ±16 g Nonlinearity Percentage of full scale ±0.5 % Inter-Axis Alignment Error ±0.1 Degrees Cross-Axis Sensitivity2 ±1 % OUTPUT RESOLUTION Each axis All g Ranges 10-bit resolution 10 Bits ±2 g Range Full resolution 10 Bits ±4 g Range Full resolution 11 Bits ±8 g Range Full resolution 12 Bits ±16 g Range Full resolution 13 Bits SENSITIVITY Each axis Sensitivity at XOUT, YOUT, ZOUT ±2 g, 10-bit or full resolution 230 256 282 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±2 g, 10-bit or full resolution 3.5 3.9 4.3 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±4 g, 10-bit resolution 115 128 141 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±4 g, 10-bit resolution 7.1 7.8 8.7 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±8 g, 10-bit resolution 57 64 71 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±8 g, 10-bit resolution 14.1 15.6 17.5 mg/LSB Sensitivity at XOUT, YOUT, ZOUT ±16 g, 10-bit resolution 29 32 35 LSB/g Scale Factor at XOUT, YOUT, ZOUT ±16 g, 10-bit resolution 28.6 31.2 34.5 mg/LSB Sensitivity Change Due to Temperature ±0.01 %/°C 0 g OFFSET Each axis 0 g Output for XOUT, YOUT, ZOUT −150 +150 mg 0 g Offset vs. Temperature for x-, y-, z-Axes <±1.0 mg/°C NOISE x-, y-Axes ODR = 100 Hz for ±2 g, 10-bit or full resolution <1.0 LSB rms z-Axis ODR = 100 Hz for ±2 g, 10-bit or full resolution <1.5 LSB rms OUTPUT DATA RATE AND BANDWIDTH User selectable Output Data Rate (ODR)3 6.25 3200 Hz SELF-TEST4 Output Change in x-Axis 0.27 1.55 g Output Change in y-Axis −1.55 −0.27 g Output Change in z-Axis 0.40 1.95 g POWER SUPPLY Operating Voltage Range (VS) 1.7 2.5 2.75 V Interface Voltage Range (VDD I/O) 1.7 1.8 VS V Supply Current ODR ≥ 100 Hz 140 µA ODR < 10 Hz 35 µA Standby Mode Leakage Current 1 10 µA Turn-On and Wake-Up Time5 ODR = 3200 Hz 1.4 ms TEMPERATURE Operating Temperature Range −40 +85 °C WEIGHT Device Weight 18 mg 1 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. 2 Cross-axis sensitivity is defined as coupling between any two axes. 3 Bandwidth is the −3 dB frequency and is half the output data rate, bandwidth = ODR/2. 4 Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register) minus the output (g) when the SELF_TEST bit = 0 (in the DATA_FORMAT register). Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self-test, where τ = 1/(data rate). The part needs to be in normal power operation (LOW_POWER bit = 0 in BW_RATE register) for self-test to operate correctly. 5 Turn-on and wake-up times are determined by the user-defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For other data rates, the turn-on and wake-up times are each approximately τ + 1.1 in milliseconds, where τ = 1/(data rate). |
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类似说明 - ADXL346BCCZ-RL |
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