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SN74ACT8997 数据表(PDF) 1 Page - Texas Instruments |
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SN74ACT8997 数据表(HTML) 1 Page - Texas Instruments |
1 / 28 page SN54ACT8997, SN74ACT8997 SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS SCAS157D – APRIL 1990 – REVISED DECEMBER 1996 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Serial Test Bus D Allow Partitioning of System Scan Paths D Can Be Cascaded Horizontally or Vertically D Select Up to Four Secondary Scan Paths to Be Included in a Primary Scan Path D Include 8-Bit Programmable Binary Counter to Count or Initiate Interrupt Signals D Include 4-Bit Identification Bus for Scan-Path Identification D Inputs Are TTL Compatible D EPIC ™ (Enhanced-Performance Implanted CMOS) 1- µm Process D Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs description The ’ACT8997 are members of the Texas Instruments SCOPE ™ testability integrated- circuit family. This family of components facilitates testing of complex circuit-board assemblies. The ’ACT8997 enhance the scan capability of TI’s SCOPE ™ family by allowing augmentation of a system’s primary scan path with secondary scan paths (SSPs), which can be individually selected by the ’ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic. By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations. All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on either the rising or falling edge of DCI. The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1. The SN54ACT8997 is characterized for operation over the full military temperature range of –55 °C to 125°C. The SN74ACT8997 is characterized for operation from 0 °C to 70°C. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 DCO MCO DTDO1 DTDO2 DTDO3 DTDO4 GND DTMS1 DTMS2 DTMS3 DTMS4 DTCK TDO TMS DCI MCI TRST ID1 ID2 ID3 ID4 VCC DTDI1 DTDI2 DTDI3 DTDI4 TDI TCK SN54ACT8997 ...JT PACKAGE SN74ACT8997 . . . DW OR NT PACKAGE (TOP VIEW) 32 1 13 14 5 6 7 8 9 10 11 DTDI3 DTDI4 TDI TCK TMS TDO DTCK TRST MCI DCI DCO MCO DTDO1 DTDO2 4 15 16 17 18 SN54ACT8997 . . . FK PACKAGE (TOP VIEW) 28 27 26 25 24 23 22 21 20 19 12 Copyright © 1996, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. SCOPE and EPIC are trademarks of Texas Instruments Incorporated. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. |
类似零件编号 - SN74ACT8997 |
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类似说明 - SN74ACT8997 |
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