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TPI12011NRL 数据表(PDF) 4 Page - STMicroelectronics |
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TPI12011NRL 数据表(HTML) 4 Page - STMicroelectronics |
4 / 7 page Characteristics TPI 4/9 Figure 5. Reference test circuit 1 Figure 6. Functional holding current (IH) test circuit 2 Auto Transformer 220 V / 2 A tp = 20 ms R2 R1 140 Ω 240 Ω Static relay IBO,IH measure VBO measure VOUT D.U.T. K Transformer 220 V / 800 V 2 A TEST PROCEDURE Pulse test duration (tp = 20 ms): V selection: ● ● ● ● for Bidirectional devices = Switch K is closed for Unidirectional devices = Switch K is open Device with V < 200 V V = 250 V , R1 = 140 OUT BO OUT RMS ➔ Ω Device with V > 200 V V = 480 V , R2 = 240 BO OUT RMS ➔ Ω R -VP V BAT = - 48 V Surge generator D.U.T. TEST PROCEDURE 1/ Adjust the current level at the IH value by short circuiting the AK of the D.U.T. 2/ Fire the D.U.T. with a surge current ➔ I 10 A, 10/1000 µs. 3/ The D.U.T. will come back off-state within 50 ms maximum. PP This is a GO-NOGO test which allows to confirm the holding current (I ) level in a functional test circuit. H |
类似零件编号 - TPI12011NRL |
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类似说明 - TPI12011NRL |
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