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74LCX02TTR 数据表(PDF) 7 Page - STMicroelectronics |
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74LCX02TTR 数据表(HTML) 7 Page - STMicroelectronics |
7 / 15 page 74LCX02 Test circuit 7/15 5 Test circuit Figure 4. Test circuit CL = 50pF or equivalent (includes jig and probe capacitance) RL = 500Ω or equivalent RT = ZOUT of pulse generator (typically 50Ω) Table 7. AC electrical characteristics Symbol Parameter Test condition Value Unit VCC (V) CL (pF) RL ( Ω) ts = tr (ns) -40 to 85 °C Min Max tPLH tPHL Propagation delay time 2.7 50 500 2.5 4.4 ns 3.0 to 3.6 1.0 5.4 tOSLH tOSHL Output to output skew time (1) (2) 1. Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switching in the same direction, either HIGH or LOW (tOSLH = | tPLHm - tPLHn|, tOSHL = | tPHLm - tPHLn|) 2. Parameter guaranteed by design 3.0 to 3.6 50 500 2.5 1.0 ns Table 8. Capacitive characteristics Symbol Parameter Test condition Value Unit VCC (V) TA = 25 °C Min Typ Max CIN Input capacitance 3.3 VIN = 0 to VCC 6pF CPD Power dissipation capacitance (1) 1. CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/4 (per gate) 3.3 fIN = 10MHz VIN = 0 or VCC 43 pF |
类似零件编号 - 74LCX02TTR |
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类似说明 - 74LCX02TTR |
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