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M27C2001-25F6TR 数据表(PDF) 4 Page - STMicroelectronics |
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M27C2001-25F6TR 数据表(HTML) 4 Page - STMicroelectronics |
4 / 16 page M27C2001 4/16 System Considerations The power switching characteristics of Advanced CMOS EPROMs require careful decoupling of the devices. The supply current, ICC, has three seg- ments that are of interest to the system designer: the standby current level, the active current level, and transient current peaks that are produced by the falling and rising edges of E. The magnitude of the transient current peaks is dependent on the capacitive and inductive loading of the device at the output. The associated transient voltage peaks can be suppressed by complying with the two line output control and by properly selected decoupling ca- pacitors. It is recommended that a 0.1 µF ceramic capacitor be used on every device between VCC and VSS. This should be a high frequency capaci- tor of low inherent inductance and should be placed as close to the device as possible. In addi- tion, a 4.7 µF bulk electrolytic capacitor should be used between VCC and VSS for every eight devic- es. The bulk capacitor should be located near the power supply connection point. The purpose of the bulk capacitor is to overcome the voltage drop caused by the inductive effects of PCB traces. Table 5. AC Measurement Conditions High Speed Standard Input Rise and Fall Times ≤ 10ns ≤ 20ns Input Pulse Voltages 0 to 3V 0.4V to 2.4V Input and Output Timing Ref. Voltages 1.5V 0.8V and 2V Figure 3. AC Testing Input Output Waveform AI01822 3V High Speed 0V 1.5V 2.4V Standard 0.4V 2.0V 0.8V Figure 4. AC Testing Load Circuit AI01823B 1.3V OUT CL CL = 30pF for High Speed CL = 100pF for Standard CL includes JIG capacitance 3.3k Ω 1N914 DEVICE UNDER TEST Table 6. Capacitance (1) (TA =25 °C, f = 1 MHz) Note: 1. Sampled only, not 100% tested. Symbol Parameter Test Condit ion Min Max Unit CIN Input Capacitance VIN =0V 6pF COUT Output Capacitance VOUT =0V 12 pF |
类似零件编号 - M27C2001-25F6TR |
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类似说明 - M27C2001-25F6TR |
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