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TDA1312AT 数据表(PDF) 8 Page - NXP Semiconductors |
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TDA1312AT 数据表(HTML) 8 Page - NXP Semiconductors |
8 / 13 page July 1993 8 Philips Semiconductors Preliminary specification Stereo continuous calibration DAC (CC-DAC) TDA1312A; TDA1312AT Note 1. Measured with 1 kHz sinewave generated at sampling rate of 192 kHz. Analog outputs; pins VOL and VOR tcs current settling time to ±1 LSB − 0.2 −µs α channel separation 75 80 − dB δI O unbalance between outputs note 1 − 0.2 0.3 dB t d time delay between outputs −±0.2 −µs S/N signal-to-noise ratio at bipolar zero A-weighted; at code 0000H 86 92 − dB SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT Fig.4 Input signals timing. handbook, full pagewidth MGE227 tCY >54 SAMPLE OUT MSB LSB DATAR DATAL BCK WS RIGHT LEFT tf <12 tr <12 tBCKL >15 tBCKH >15 tHD; WS >2 tSU; DAT >12 tHD; DAT >2 tSU; WS >12 |
类似零件编号 - TDA1312AT |
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类似说明 - TDA1312AT |
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