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AM29F200BB-75DGI1 数据表(PDF) 8 Page - Advanced Micro Devices |
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AM29F200BB-75DGI1 数据表(HTML) 8 Page - Advanced Micro Devices |
8 / 11 page Am29F200B Known Good Die 7 SU PPL EMEN T PRODUCT TEST FLOW Figure 1 provides an overview of AMD’s Known Good Die test flow. For more detailed information, refer to the Am29F200B product qualification database supple- ment for KGD. AMD implements quality assurance pro- cedures throughout the product test flow. In addition, an off-line quality monitoring program (QMP) further guarantees AMD quality standards are met on Known Good Die products. These QA procedures also allow AMD to produce KGD products without requiring or implementing burn-in. Figure 1. AMD KGD Product Test Flow Wafer Sort 1 Bake 24 hours at 250 °C Wafer Sort 2 Wafer Sort 3 Hot Temperature Packaging for Shipment Shipment DC Parameters Functionality Programmability Erasability Data Retention DC Parameters Functionality Programmability Erasability DC Parameters Functionality Programmability Erasability Speed Incoming Inspection Wafer Saw Die Separation 100% Visual Inspection Die Pack |
类似零件编号 - AM29F200BB-75DGI1 |
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类似说明 - AM29F200BB-75DGI1 |
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