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CAT25C16AP-12T 数据表(PDF) 4 Page - Catalyst Semiconductor |
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CAT25C16AP-12T 数据表(HTML) 4 Page - Catalyst Semiconductor |
4 / 10 page CAT28C16A 4 Doc. No. 1076, Rev. D Figure 1. A.C. Testing Input/Output Waveform(3) Figure 2. A.C. Testing Load Circuit (example) Note: (1) This parameter is tested initially and after a design or process change that affects the parameter. (2) Output floating (High-Z) is defined as the state when the external data line is no longer driven by the output buffer. (3) Input rise and fall times (10% and 90%) < 10 ns. INPUT PULSE LEVELS REFERENCE POINTS 2.0 V 0.8 V 2.4 V 0.45 V 1.3V DEVICE UNDER TEST 1N914 3.3K CL = 100 pF OUT CL INCLUDES JIG CAPACITANCE A.C. CHARACTERISTICS, Read Cycle VCC = 5V ±10%, unless otherwise specified. 28C16A-9028C16A-12 28C16A-20 Symbol Parameter Min Max Min Max Min Max Units tRC Read Cycle Time 90 120 200 ns tCE CE Access Time 90 120 200 ns tAA Address Access Time 90 120 200 ns tOE OE Access Time 50 60 80 ns tLZ(1) CE Low to Active Output 0 0 0 ns tOLZ(1) OE Low to Active Output 0 0 0 ns tHZ(1)(2) CE High to High-Z Output 50 50 55 ns tOHZ(1)(2) OE High to High-Z Output 50 50 55 ns tOH(1) Output Hold from Address Change 0 0 0 ns |
类似零件编号 - CAT25C16AP-12T |
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类似说明 - CAT25C16AP-12T |
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