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MC100EP40 数据表(PDF) 3 Page - ON Semiconductor

部件名 MC100EP40
功能描述  3.3V / 5V ECL Differential Phase?묯requency Detector
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制造商  ONSEMI [ON Semiconductor]
网页  http://www.onsemi.com
标志 ONSEMI - ON Semiconductor

MC100EP40 数据表(HTML) 3 Page - ON Semiconductor

  MC100EP40_06 Datasheet HTML 1Page - ON Semiconductor MC100EP40_06 Datasheet HTML 2Page - ON Semiconductor MC100EP40_06 Datasheet HTML 3Page - ON Semiconductor MC100EP40_06 Datasheet HTML 4Page - ON Semiconductor MC100EP40_06 Datasheet HTML 5Page - ON Semiconductor MC100EP40_06 Datasheet HTML 6Page - ON Semiconductor MC100EP40_06 Datasheet HTML 7Page - ON Semiconductor MC100EP40_06 Datasheet HTML 8Page - ON Semiconductor MC100EP40_06 Datasheet HTML 9Page - ON Semiconductor  
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MC100EP40
http://onsemi.com
3
Table 2. ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
N/A
Internal Input Pullup Resistor
N/A
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 4 kV
> 100 V
> 2 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 1)
Pb Pkg
Pb−Free Pkg
TSSOP−20
Level 1
Level 3
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
699 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
PECL Mode Power Supply
VEE = 0 V
6
V
VEE
NECL Mode Power Supply
VCC = 0 V
−6
V
VI
PECL Mode Input Voltage
NECL Mode Input Voltage
VEE = 0 V
VCC = 0 V
VI v VCC
VI w VEE
6
−6
V
V
Iout
Output Current
Continuous
Surge
50
100
mA
mA
IBB
VBB Sink/Source
± 0.5
mA
TA
Operating Temperature Range
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient)
0 lfpm
500 lfpm
TSSOP−20
TSSOP−20
140
100
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
Standard Board
TSSOP−20
23 to 41
°C/W
Tsol
Wave Solder
Pb
Pb−Free
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.


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