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MC74AC374DTR2G 数据表(PDF) 2 Page - ON Semiconductor |
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MC74AC374DTR2G 数据表(HTML) 2 Page - ON Semiconductor |
2 / 10 page MC74AC374, MC74ACT374 http://onsemi.com 2 TRUTH TABLE Inputs Outputs Dn CP OE On H L H L L L X X H Z H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance = LOW-to-HIGH Transition FUNCTIONAL DESCRIPTION The MC74AC374/74ACT374 consists of eight edge− triggered flip−flops with individual D−type inputs and 3−state true outputs. The buffered clock and buffered Output Enable are common to all flip−flops. The eight flip−flops will store the state of their individual D inputs that meet the setup and hold time requirements on the LOW−to−HIGH Clock (CP) transition. With the Output Enable (OE) LOW, the contents of the eight flip−flops are available at the outputs. When the OE is HIGH, the outputs go to the high impedance state. Operation of the OE input does not affect the state of the flip−flops. Figure 3. Logic Diagram CP D QQ CP D QQ CP D QQ CP D QQ CP D QQ CP D QQ CP D QQ CP D QQ D0 D1 D2 D3 D4 D5 D6 D7 O0 O1 O2 O3 O4 O5 O6 O7 OE CP NOTE: That this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays. MAXIMUM RATINGS Symbol Parameter Value Unit VCC DC Supply Voltage (Referenced to GND) −0.5 to +7.0 V VIN DC Input Voltage (Referenced to GND) −0.5 to VCC +0.5 V VOUT DC Output Voltage (Referenced to GND) −0.5 to VCC +0.5 V IIN DC Input Current, per Pin ±20 mA IOUT DC Output Sink/Source Current, per Pin ±50 mA ICC DC VCC or GND Current per Output Pin ±50 mA Tstg Storage Temperature −65 to +150 °C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. |
类似零件编号 - MC74AC374DTR2G |
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类似说明 - MC74AC374DTR2G |
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