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AM29PDS322DT10WMI 数据表(PDF) 10 Page - SPANSION

部件名 AM29PDS322DT10WMI
功能描述  32 Megabit (2 M x 16-Bit) CMOS 1.8 Volt-only (1.8 V to 2.2 V) Simultaneous Read/Write Page-Mode Boot Sector Flash Memory
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AM29PDS322DT10WMI 数据表(HTML) 10 Page - SPANSION

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Am29PDS322D
23569A5 December 4, 2006
D A TA
SH EE T
DEVICE BUS OPERATIONS
This section describes the requirements and use of
the device bus operations, which are initiated through
the internal command register. The command register
itself does not occupy any addressable memory loca-
tion. The register is a latch used to store the com-
mands, along with the address and data information
needed to execute the command. The contents of the
register serve as inputs to the internal state machine.
The state machine outputs dictate the function of the
device. Table 1 lists the device bus operations, the in-
puts and control levels they require, and the resulting
output. The following subsections describe each of
these operations in further detail.
Table 1.
Am29PDS322D Device Bus Operations
Legend: L = Logic Low = V
IL, H = Logic High = VIH, VID = 9.0–11.0 V, VHH = 9.0 ± 0.5 V, X = Don’t Care, SA = Sector Address,
A
IN = Address In, DIN = Data In, DOUT = Data Out
Notes:
1. The sector protect and sector unprotect functions may also be implemented via programming equipment. See the “Sector/Sector
Block Protection and Unprotection” section.
2. If WP#/ACC = VIL, the two outermost boot sectors remain protected. If WP#/ACC = VIH, the two outermost boot sector
protection depends on whether they were last protected or unprotected using the method described in “Sector/Sector Block
Protection and Unprotection”. If WP#/ACC = VHH, all sectors will be unprotected.
Requirements for Reading Array Data
To read array data from the outputs, the system must
drive the CE# and OE# pins to V
IL. CE# is the power
control and selects the device. OE# is the output con-
trol and gates array data to the output pins. WE#
should remain at V
IH.
The internal state machine is set for reading array data
upon device power-up, or after a hardware reset. This
ensures that no spurious alteration of the memory
content occurs during the power transition. No com-
mand is necessary in this mode to obtain array data.
Standard microprocessor read cycles that assert valid
addresses on the device address inputs produce valid
data on the device data outputs. The device remains
enabled for read access until the command register
contents are altered.
See “Requirements for Reading Array Data” for more
information. Refer to the AC Read-Only Operations
table for timing specifications and to Figure 15 for the
timing diagram. I
CC1 in the DC Characteristics table
represents the active current specification for reading
array data.
Read Mode
Random Read (Non-Page Mode Read)
The device has two control functions which must be
satisfied in order to obtain data at the outputs. CE# is
the power control and should be used for device selec-
tion. OE# is the output control and should be used to
gate data to the output pins if the device is selected.
Address access time (t
ACC) is equal to the delay from
stable addresses to valid output data. The chip enable
access time (t
CE) is the delay from the stable ad-
dresses and stable CE# to valid data at the output
pins. The output enable access time is the delay from
the falling edge of OE# to valid data at the output pins
(assuming the addresses have been stable for at least
t
ACC–tOE time).
Operation
CE#
OE#
WE#
RESET#
WP#/ACC
Addresses
(Note 1)
DQ0–DQ15
Read
L
L
H
H
L/H
A
IN
D
OUT
Write
L
H
L
H
(Note 2)
A
IN
D
IN
Standby
V
CC ± 0.3 V
X
X
V
CC ± 0.3 V
H
X
High-Z
Output Disable
L
H
H
H
L/H
X
High-Z
Reset
X
X
X
L
L/H
X
High-Z
Sector Protect (Note 1)
L
H
L
VID
L/H
SA, A6 = L,
A1 = H, A0 = L
DIN
Sector Unprotect (Note 1)
L
H
L
V
ID
(Note 2)
SA, A6 = H,
A1 = H, A0 = L
D
IN
Temporary Sector Unprotect
X
X
X
VID
(Note 2)
AIN
DIN


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