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74F524 数据表(PDF) 7 Page - NXP Semiconductors |
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74F524 数据表(HTML) 7 Page - NXP Semiconductors |
7 / 14 page Philips Semiconductors Product specification 74F524 8-bit register comparator (open collector + 3-State) 1990 Aug 07 7 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) SYMBOL PARAMETER TEST CONDITIONSNO TAG LIMITS UNIT SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP2 MAX UNIT IOH High-level output current LT, EQ, GT only VCC = MIN, VIL = MAX, VIH = MIN, VOH = MAX 250 µA C/SO only VCC = MIN ±10%VCC 2.5 V VOH High-level output voltage I/On only VCC = MIN, VIL = MAX, V MIN IOH=MAX ±10%VCC 2.4 V I/On only VIH = MIN ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX IO = MAX ±10%VCC 0.35 0.50 V VOL Low-level output voltage VIL = MAX, VIH = MIN IOL = MAX ±5%VCC 0.35 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum I/On VCC = MAX, VI = 5.5V 1 mA II input voltage Except I/On VCC = MAX, VI = 7.0V 100 µA IIH High-level input current Except I/On VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current Except I/On VCC = MAX, VI = 0.5V –0.6 mA IOZH Off-state output current High-level voltage applied I/On only VCC = MAX, VO = 2.7V 70 µA IOZL Off-state output current Low-level voltage applied I/On only VCC = MAX, VO = 0.5V –0.6 mA IOS Short-circuit output current3 Except LT, EQ, GT VCC = MAX –60 –150 mA ICC Supply current (total) VCC = MAX 110 150 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
类似零件编号 - 74F524 |
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类似说明 - 74F524 |
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