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1N4117DUR-1 数据表(PDF) 3 Page - Microsemi Corporation |
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1N4117DUR-1 数据表(HTML) 3 Page - Microsemi Corporation |
3 / 3 page Microsemi Scottsdale Division 8700 E. Thomas Rd. PO Box 1390, Scottsdale, AZ 85252 USA, (480) 941-6300, Fax: (480) 947-1503 Page 3 Copyright 2002 11-05-03 REV C SCOTTSD A L E DIVISION 1N4099UR thru 1N4135UR (or MLL4099 thru MLL4135) and 1N4614UR thru 1N4627UR (or MLL4614 thru MLL4627) GRAPHS and CIRCUIT TEC TA TEC, End Cap Temperature ( oC) or TA Ambient temperature on FR4 PC board FIGURE 2 Power Derating Curve Capacitance vs. VZ Curve FIGURE 1 Noise Density Measurement Circuit FIGURE 3 Capacitance vs. Zener Voltage (Typical) Zener Voltage VZ Noise density, (ND) is specified in microvolt-rms per squre- root-hertz. Actual measurement is performed using a 1 KHz to 3 KHz frequency bandpass filter at a constant Zener test current (IZT) AT 25 oC ambient temperature. ND is calculated from the formula. PACKAGE DIMENSIONS INCHES MILLIMETERS DIM MIN MAX MIN MAX A 0.063 0.067 1.60 1.70 B 0.130 0.146 3.30 3.70 C 0.016 0.022 0.41 0.55 PAD LAYOUT INCHES mm A .200 5.08 B .055 1.40 C .080 2.03 |
类似零件编号 - 1N4117DUR-1 |
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类似说明 - 1N4117DUR-1 |
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